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Mohan, S.; Mueller, F.; Root, M.; Hawkins, W.; Healy, C.; Whalley, D.; Vivancos Rubio, E. (2011). Parametric Timing Analisys and Its Appication to Dynamic Voltage Scaling. ACM Transactions on Embedded Computing Systems. 10(2):1-34. doi:10.1145/1880050.1880061
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Título: | Parametric Timing Analisys and Its Appication to Dynamic Voltage Scaling | |
Autor: | Mohan, S. Mueller, F. Root, M. Hawkins, W. Healy, C. Whalley, D. | |
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Embedded systems with real-time constraints depend on a priori knowledge of worst-case execution times (WCETs) to determine if tasks meet deadlines. Static timing analysis derives bounds on WCETs but requires statically ...[+]
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Derechos de uso: | Cerrado | |
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Versión del editor: | http://dx.doi.org/10.1145/1880050.1880061 | |
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This work was conducted at North Carolina State University and Florida State University; it was supported in part by NSF grants CCR-0208581, CCR-0310860, CCR-0312695, EIA-0072043, CCR-0208892, CCR-0312493 and CCR-0312531.[+]
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