- -

Characterizing the impact of process variation on 45 nm NoC-based CMPs

RiuNet: Institutional repository of the Polithecnic University of Valencia

Share/Send to

Cited by

Statistics

Characterizing the impact of process variation on 45 nm NoC-based CMPs

Show full item record

Hernández Luz, C.; Roca Pérez, A.; Flich Cardo, J.; Silla Jiménez, F.; Duato Marín, JF. (2011). Characterizing the impact of process variation on 45 nm NoC-based CMPs. Journal of Parallel and Distributed Computing. 71(5):651-663. doi:10.1016/j.jpdc.2010.09.006

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/37694

Files in this item

Item Metadata

Title: Characterizing the impact of process variation on 45 nm NoC-based CMPs
Author:
UPV Unit: Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors
Universitat Politècnica de València. Grupo de Arquitecturas Paralelas
Issued date:
Abstract:
[EN] Current integration scales make possible to design chip multiprocessors with a large amount of cores interconnected by a NoC. Unfortunately, they also bring process variation, posing a new burden to processor ...[+]
Subjects: CMP (or Chip multiprocessor) , NoC (or Network-on-Chip) , Process mapping , Process variations , Router design , Chip Multiprocessor , Conformal mapping , Design , Microprocessor chips , Multiprocessing systems , Servers , Systems analysis , VLSI circuits , Routers
Copyrigths: Cerrado
Source:
Journal of Parallel and Distributed Computing. (issn: 0743-7315 )
DOI: 10.1016/j.jpdc.2010.09.006
Publisher:
Elsevier
Publisher version: http://dx.doi.org/10.1016/j.jpdc.2010.09.006
Project ID: info:eu-repo/grantAgreement/EC/FP7/248972
Thanks:
This work was supported by the Spanish MEC and MICINN, as well as European Comission FEDER funds, under Grants CSD2006-00046 and TIN2009-14475-C04. It was also partly supported by the project NaNoC (project label 248972) ...[+]
Type: Artículo

This item appears in the following Collection(s)

Show full item record