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Experimental verification of total absorption by a low-loss thin dielectric layer

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Experimental verification of total absorption by a low-loss thin dielectric layer

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Diaz Rubio, A.; Hibbins, A.; Carbonell Olivares, J.; Sánchez-Dehesa Moreno-Cid, J. (2015). Experimental verification of total absorption by a low-loss thin dielectric layer. Applied Physics Letters. 106(24):241604-1-241604-5. doi:10.1063/1.4922801

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/64461

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Title: Experimental verification of total absorption by a low-loss thin dielectric layer
Author:
UPV Unit: Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica
Universitat Politècnica de València. Departamento de Estadística e Investigación Operativa Aplicadas y Calidad - Departament d'Estadística i Investigació Operativa Aplicades i Qualitat
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Abstract:
This work presents an experimental demonstration of total absorption by a metal-dielectric metasurface. Following a theoretical proposal [Dıaz-Rubio et al., Phys. Rev. B 89, 245123 (2014)], we have designed and ...[+]
Copyrigths: Reserva de todos los derechos
Source:
Applied Physics Letters. (issn: 0003-6951 )
DOI: 10.1063/1.4922801
Publisher:
American Institute of Physics (AIP)
Publisher version: http://dx.doi.org/10.1063/1.4922801
Thanks:
This work was partially supported by the Spanish Ministerio de Economia y Competitividad (MINECO) under Contract No. TEC2010-19751 and the USA office of Naval Research, under Grant No. N000141210216. A. Hibbins acknowledges ...[+]
Type: Artículo

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