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Experimental verification of total absorption by a low-loss thin dielectric layer

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Experimental verification of total absorption by a low-loss thin dielectric layer

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dc.contributor.author Díaz Rubio, Ana es_ES
dc.contributor.author Hibbins, A.P. es_ES
dc.contributor.author Carbonell Olivares, Jorge es_ES
dc.contributor.author Sánchez-Dehesa Moreno-Cid, José es_ES
dc.date.accessioned 2016-05-20T09:02:32Z
dc.date.available 2016-05-20T09:02:32Z
dc.date.issued 2015-06-15
dc.identifier.issn 0003-6951
dc.identifier.uri http://hdl.handle.net/10251/64461
dc.description.abstract This work presents an experimental demonstration of total absorption by a metal-dielectric metasurface. Following a theoretical proposal [Dıaz-Rubio et al., Phys. Rev. B 89, 245123 (2014)], we have designed and fabricated a metasurface consisting of a low absorbing dielectric layer (made of FR4) placed on top of a metallic surface patterned with a square array of coaxial cavities. For p-polarized waves, a low frequency peak with perfect absorption is observed. The behavior of this peak has been experimentally characterized for different dielectric layer thicknesses, coaxial cavity lengths, and angles of incidence. The experimental results are in excellent agreement with numerical simulation and corroborate the theoretical predictions. es_ES
dc.description.sponsorship This work was partially supported by the Spanish Ministerio de Economia y Competitividad (MINECO) under Contract No. TEC2010-19751 and the USA office of Naval Research, under Grant No. N000141210216. A. Hibbins acknowledges support from the UK Grant No. EEBB-I-1408331. We thank useful discussions with Daniel Torrent and the technical help of Benjamin Tremain. en_EN
dc.language Inglés es_ES
dc.publisher American Institute of Physics (AIP) es_ES
dc.relation Spanish Ministerio de Economia y Competitividad (MINECO) TEC2010-19751 es_ES
dc.relation USA office of Naval Research N000141210216 EEBB-I-1408331 es_ES
dc.relation.ispartof Applied Physics Letters es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject.classification ESTADISTICA E INVESTIGACION OPERATIVA es_ES
dc.subject.classification TEORIA DE LA SEÑAL Y COMUNICACIONES es_ES
dc.subject.classification TECNOLOGIA ELECTRONICA es_ES
dc.title Experimental verification of total absorption by a low-loss thin dielectric layer es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1063/1.4922801
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Estadística e Investigación Operativa Aplicadas y Calidad - Departament d'Estadística i Investigació Operativa Aplicades i Qualitat es_ES
dc.description.bibliographicCitation Diaz Rubio, A.; Hibbins, A.; Carbonell Olivares, J.; Sánchez-Dehesa Moreno-Cid, J. (2015). Experimental verification of total absorption by a low-loss thin dielectric layer. Applied Physics Letters. 106(24):241604-1-241604-5. doi:10.1063/1.4922801 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1063/1.4922801 es_ES
dc.description.upvformatpinicio 241604-1 es_ES
dc.description.upvformatpfin 241604-5 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 106 es_ES
dc.description.issue 24 es_ES
dc.relation.senia 304213 es_ES


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