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Double Laser for Depth Measurement of Thin Films of Ice

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Double Laser for Depth Measurement of Thin Films of Ice

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Domingo Beltran, M.; Luna Molina, R.; Satorre, MÁ.; Santonja Moltó, MDC.; Millán Verdú, C. (2015). Double Laser for Depth Measurement of Thin Films of Ice. Sensors. 15(10):25123-25138. doi:10.3390/s151025123

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/64695

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Title: Double Laser for Depth Measurement of Thin Films of Ice
Author:
UPV Unit: Universitat Politècnica de València. Centro de Tecnologías Físicas: Acústica, Materiales y Astrofísica - Centre de Tecnologies Físiques: Acústica, Materials i Astrofísica
Universitat Politècnica de València. Departamento de Física Aplicada - Departament de Física Aplicada
Issued date:
Abstract:
The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 μm) in real time ...[+]
Subjects: Thin films , Thickness , Refractive index
Copyrigths: Reconocimiento (by)
Source:
Sensors. (issn: 1424-8220 )
DOI: 10.3390/s151025123
Publisher:
MDPI
Publisher version: http://dx.doi.org/10.3390/s151025123
Thanks:
This work was supported by the Spanish Ministry of Education and Science (co-financed by AYA 2009-12 974 funds).
Type: Artículo

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