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Double Laser for Depth Measurement of Thin Films of Ice

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Double Laser for Depth Measurement of Thin Films of Ice

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Domingo Beltran, M.; Luna Molina, R.; Satorre, MÁ.; Santonja Moltó, MDC.; Millán Verdú, C. (2015). Double Laser for Depth Measurement of Thin Films of Ice. Sensors. 15(10):25123-25138. doi:10.3390/s151025123

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Título: Double Laser for Depth Measurement of Thin Films of Ice
Autor: Domingo Beltran, Manuel Luna Molina, Ramón Satorre, M. Á. Santonja Moltó, Mª del Carmen Millán Verdú, Carlos
Entidad UPV: Universitat Politècnica de València. Centro de Tecnologías Físicas: Acústica, Materiales y Astrofísica - Centre de Tecnologies Físiques: Acústica, Materials i Astrofísica
Universitat Politècnica de València. Departamento de Física Aplicada - Departament de Física Aplicada
Fecha difusión:
Resumen:
The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 μm) in real time ...[+]
Palabras clave: Thin films , Thickness , Refractive index
Derechos de uso: Reconocimiento (by)
Fuente:
Sensors. (issn: 1424-8220 )
DOI: 10.3390/s151025123
Editorial:
MDPI
Versión del editor: http://dx.doi.org/10.3390/s151025123
Código del Proyecto:
info:eu-repo/grantAgreement/MICINN//AYA2009-12974/ES/Estudio De Analogos De Hielos Para Astrofisica En El Laboratorio: Espectroscopia Fir Y Parametros Fisicos/
Agradecimientos:
This work was supported by the Spanish Ministry of Education and Science (co-financed by AYA 2009-12 974 funds).
Tipo: Artículo

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