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Double Laser for Depth Measurement of Thin Films of Ice

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Double Laser for Depth Measurement of Thin Films of Ice

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dc.contributor.author Domingo Beltran, Manuel es_ES
dc.contributor.author Luna Molina, Ramón es_ES
dc.contributor.author Satorre, M. Á. es_ES
dc.contributor.author Santonja Moltó, Mª del Carmen es_ES
dc.contributor.author Millán Verdú, Carlos es_ES
dc.date.accessioned 2016-05-25T11:36:19Z
dc.date.available 2016-05-25T11:36:19Z
dc.date.issued 2015-10
dc.identifier.issn 1424-8220
dc.identifier.uri http://hdl.handle.net/10251/64695
dc.description.abstract The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 μm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we can also measure the refractive index of the thin film material exactly under the same experimental conditions. We have also obtained interesting results with regard to structural changes in the solid substance with changing temperature and have observed the corresponding behavior of mixtures of substances. es_ES
dc.description.sponsorship This work was supported by the Spanish Ministry of Education and Science (co-financed by AYA 2009-12 974 funds). en_EN
dc.language Inglés es_ES
dc.publisher MDPI es_ES
dc.relation Spanish Ministry of Education and Science es_ES
dc.relation AYA funds 2009-12 974 es_ES
dc.relation.ispartof Sensors es_ES
dc.rights Reconocimiento (by) es_ES
dc.subject Thin films es_ES
dc.subject Thickness es_ES
dc.subject Refractive index es_ES
dc.subject.classification FISICA APLICADA es_ES
dc.title Double Laser for Depth Measurement of Thin Films of Ice es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.3390/s151025123
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Centro de Tecnologías Físicas: Acústica, Materiales y Astrofísica - Centre de Tecnologies Físiques: Acústica, Materials i Astrofísica es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Física Aplicada - Departament de Física Aplicada es_ES
dc.description.bibliographicCitation Domingo Beltran, M.; Luna Molina, R.; Satorre, MÁ.; Santonja Moltó, MDC.; Millán Verdú, C. (2015). Double Laser for Depth Measurement of Thin Films of Ice. Sensors. 15(10):25123-25138. doi:10.3390/s151025123 es_ES
dc.description.accrualMethod Senia es_ES
dc.relation.publisherversion http://dx.doi.org/10.3390/s151025123 es_ES
dc.description.upvformatpinicio 25123 es_ES
dc.description.upvformatpfin 25138 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 15 es_ES
dc.description.issue 10 es_ES
dc.relation.senia 293920 es_ES
dc.identifier.pmid 26426024 en_EN
dc.identifier.pmcid PMC4634385 en_EN


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