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What do we know about the Defect Types detected in Conceptual Models?

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What do we know about the Defect Types detected in Conceptual Models?

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Granda Juca, MF.; Condori Fernández, ON.; Vos, TE.; Pastor López, O. (2015). What do we know about the Defect Types detected in Conceptual Models?. IEEE. doi:10.1109/RCIS.2015.7128867

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Título: What do we know about the Defect Types detected in Conceptual Models?
Autor:
Entidad UPV: Universitat Politècnica de València. Departamento de Sistemas Informáticos y Computación - Departament de Sistemes Informàtics i Computació
Fecha difusión:
Resumen:
In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have ...[+]
Palabras clave: Conceptual Schema Defects , Defect Classification Scheme , Systematic Mapping Study , Model-Driven Development
Derechos de uso: Reserva de todos los derechos
ISBN: 978-1-4673-6630-4
Fuente:
(issn: 2151-1349 )
DOI: 10.1109/RCIS.2015.7128867
Editorial:
IEEE
Versión del editor: http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7121393
Título del congreso: 9th IEEE International Conference on Research Challenges in Information Science (RCIS 2015)
Lugar del congreso: Athens, Greece
Fecha congreso: May 13-15, 2015
Descripción: ©2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Tipo: Comunicación en congreso

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