Granda Juca, MF.; Condori Fernández, ON.; Vos, TE.; Pastor López, O. (2015). What do we know about the Defect Types detected in Conceptual Models?. IEEE. doi:10.1109/RCIS.2015.7128867
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/66682
Title:
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What do we know about the Defect Types detected in Conceptual Models?
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Author:
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Granda Juca, María Fernanda
Condori Fernández, Olinda Nelly
Vos, Tanja Ernestina
Pastor López, Oscar
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UPV Unit:
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Universitat Politècnica de València. Departamento de Sistemas Informáticos y Computación - Departament de Sistemes Informàtics i Computació
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Issued date:
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Abstract:
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In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have ...[+]
In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have reported on defect types at model level, there still does not exist a clear and complete overview of the defect types that occur at the abstraction level.
This paper presents a systematic mapping study to identify the model defect types reported in the literature and determine how they have been detected. Among the 282 articles published in software engineering area, 28 articles were selected for analysis. A total of 226 defects were identified, classified and their results analysed. For this, an appropriate defect classification scheme was built based on appropriate dimensions for models in an MDD context.
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Subjects:
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Conceptual Schema Defects
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Defect Classification Scheme
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Systematic Mapping Study
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Model-Driven Development
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Copyrigths:
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Reserva de todos los derechos
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ISBN:
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978-1-4673-6630-4
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Source:
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DOI:
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10.1109/RCIS.2015.7128867
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Publisher:
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IEEE
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Publisher version:
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7121393
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Conference name:
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9th IEEE International Conference on Research Challenges in Information Science (RCIS 2015)
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Conference place:
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Athens, Greece
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Conference date:
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May 13-15, 2015
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Description:
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©2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
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Thanks:
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This work has been supported bythe Secretary of Higher Education, Science and Technology (SENESCYT: Secretaría Nacional de Educación Superior, Ciencia y Tecnología), of the Republic of Ecuador.
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Type:
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Comunicación en congreso
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