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What do we know about the Defect Types detected in Conceptual Models?

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What do we know about the Defect Types detected in Conceptual Models?

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dc.contributor.author Granda Juca, María Fernanda es_ES
dc.contributor.author Condori Fernández, Olinda Nelly es_ES
dc.contributor.author Vos, Tanja Ernestina es_ES
dc.contributor.author Pastor López, Oscar es_ES
dc.date.accessioned 2016-06-28T11:43:54Z
dc.date.available 2016-06-28T11:43:54Z
dc.date.issued 2015-05
dc.identifier.isbn 978-1-4673-6630-4
dc.identifier.issn 2151-1349
dc.identifier.uri http://hdl.handle.net/10251/66682
dc.description ©2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. es_ES
dc.description.abstract In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have reported on defect types at model level, there still does not exist a clear and complete overview of the defect types that occur at the abstraction level. This paper presents a systematic mapping study to identify the model defect types reported in the literature and determine how they have been detected. Among the 282 articles published in software engineering area, 28 articles were selected for analysis. A total of 226 defects were identified, classified and their results analysed. For this, an appropriate defect classification scheme was built based on appropriate dimensions for models in an MDD context. es_ES
dc.description.sponsorship This work has been supported bythe Secretary of Higher Education, Science and Technology (SENESCYT: Secretaría Nacional de Educación Superior, Ciencia y Tecnología), of the Republic of Ecuador. es_ES
dc.format.extent 12 es_ES
dc.language Inglés es_ES
dc.publisher IEEE es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Conceptual Schema Defects es_ES
dc.subject Defect Classification Scheme es_ES
dc.subject Systematic Mapping Study es_ES
dc.subject Model-Driven Development es_ES
dc.subject.classification LENGUAJES Y SISTEMAS INFORMATICOS es_ES
dc.title What do we know about the Defect Types detected in Conceptual Models? es_ES
dc.type Comunicación en congreso es_ES
dc.identifier.doi 10.1109/RCIS.2015.7128867
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Sistemas Informáticos y Computación - Departament de Sistemes Informàtics i Computació es_ES
dc.description.bibliographicCitation Granda Juca, MF.; Condori Fernández, ON.; Vos, TE.; Pastor López, O. (2015). What do we know about the Defect Types detected in Conceptual Models?. IEEE. doi:10.1109/RCIS.2015.7128867 es_ES
dc.description.accrualMethod S es_ES
dc.relation.conferencename 9th IEEE International Conference on Research Challenges in Information Science (RCIS 2015) es_ES
dc.relation.conferencedate May 13-15, 2015 es_ES
dc.relation.conferenceplace Athens, Greece es_ES
dc.relation.publisherversion http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7121393 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.relation.senia 291370 es_ES
dc.contributor.funder Secretaría de Educación Superior, Ciencia, Tecnología e Innovación, Ecuador es_ES


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