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Application of the Monte Carlo method to analyze materials used in flat panel detectors to obtain X-ray spectra

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Application of the Monte Carlo method to analyze materials used in flat panel detectors to obtain X-ray spectra

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Gallardo Bermell, S.; Pozuelo, F.; Querol Vives, A.; Ródenas Diago, J.; Verdú Martín, GJ. (2015). Application of the Monte Carlo method to analyze materials used in flat panel detectors to obtain X-ray spectra. Annals of Nuclear Energy. 82:240-251. doi:10.1016/j.anucene.2014.08.065

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/70597

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Title: Application of the Monte Carlo method to analyze materials used in flat panel detectors to obtain X-ray spectra
Author:
UPV Unit: Universitat Politècnica de València. Departamento de Ingeniería Química y Nuclear - Departament d'Enginyeria Química i Nuclear
Universitat Politècnica de València. Instituto de Seguridad Industrial, Radiofísica y Medioambiental - Institut de Seguretat Industrial, Radiofísica i Mediambiental
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Abstract:
An accurate knowledge of the photon spectra emitted by X-ray tubes in radiodiagnostic is essential to better estimate the imparted dose to patients and to improve the quality image obtained with these devices. In this ...[+]
Subjects: Flat panel , Monte Carlo , Unfolding , Scintillator materials
Copyrigths: Reserva de todos los derechos
Source:
Annals of Nuclear Energy. (issn: 0306-4549 )
DOI: 10.1016/j.anucene.2014.08.065
Publisher:
Elsevier Masson
Publisher version: http://dx.doi.org/10.1016/j.anucene.2014.08.065
Type: Artículo

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