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Application of the Monte Carlo method to analyze materials used in flat panel detectors to obtain X-ray spectra

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Application of the Monte Carlo method to analyze materials used in flat panel detectors to obtain X-ray spectra

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dc.contributor.author Gallardo Bermell, Sergio es_ES
dc.contributor.author Pozuelo, Fausto es_ES
dc.contributor.author Querol Vives, Andrea es_ES
dc.contributor.author Ródenas Diago, José es_ES
dc.contributor.author Verdú Martín, Gumersindo Jesús es_ES
dc.date.accessioned 2016-09-29T07:04:59Z
dc.date.available 2016-09-29T07:04:59Z
dc.date.issued 2015-08
dc.identifier.issn 0306-4549
dc.identifier.uri http://hdl.handle.net/10251/70597
dc.description.abstract An accurate knowledge of the photon spectra emitted by X-ray tubes in radiodiagnostic is essential to better estimate the imparted dose to patients and to improve the quality image obtained with these devices. In this work, it is proposed the use of a flat panel detector together with a PMMA wedge to estimate the actual X-ray spectrum using the Monte Carlo method and unfolding techniques. The MCNP5 code has been used to model different flat panels (based on indirect and direct methods to produce charge carriers from absorbed X-rays) and to obtain the dose curves and system response functions. Most of the actual flat panel devices use scintillator materials that present K-edge discontinuities in the mass energy-absorption coefficient, which strongly affect the response matrix. In this paper, the applicability of different flat panels for reconstructing X-ray spectra is studied. The effect of the mass energyabsorption coefficient of the scintillator material has been studied on the response matrix and consequently, in the reconstructed spectra. Different unfolding methods are tested to reconstruct the actual X-ray spectrum knowing the dose curve and the response function. It has been concluded that the regularization method Modified Truncated Singular Value Decomposition (MTSVD) is appropriate to unfold X-ray spectra in all the scintillators studied. es_ES
dc.language Inglés es_ES
dc.publisher Elsevier Masson es_ES
dc.relation.ispartof Annals of Nuclear Energy es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Flat panel es_ES
dc.subject Monte Carlo es_ES
dc.subject Unfolding es_ES
dc.subject Scintillator materials es_ES
dc.subject.classification INGENIERIA NUCLEAR es_ES
dc.title Application of the Monte Carlo method to analyze materials used in flat panel detectors to obtain X-ray spectra es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1016/j.anucene.2014.08.065
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería Química y Nuclear - Departament d'Enginyeria Química i Nuclear es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto de Seguridad Industrial, Radiofísica y Medioambiental - Institut de Seguretat Industrial, Radiofísica i Mediambiental es_ES
dc.description.bibliographicCitation Gallardo Bermell, S.; Pozuelo, F.; Querol Vives, A.; Ródenas Diago, J.; Verdú Martín, GJ. (2015). Application of the Monte Carlo method to analyze materials used in flat panel detectors to obtain X-ray spectra. Annals of Nuclear Energy. 82:240-251. doi:10.1016/j.anucene.2014.08.065 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1016/j.anucene.2014.08.065 es_ES
dc.description.upvformatpinicio 240 es_ES
dc.description.upvformatpfin 251 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 82 es_ES
dc.relation.senia 292156 es_ES


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