Gil Tomás, Daniel Antonio; Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz-Adalid, Luis-J.; Gil, Pedro(Institute of Electrical and Electronics Engineers (IEEE), 2012-12)
Intermittent faults, being serious concerns for deep-submicron integrated circuits, are not well studied in the literature. This paper performs fault injection simulation to analyze the impact of intermittent faults, which ...
Baraza Calvo, Juan Carlos(Universitat Politècnica de València, 2008-06-23)
En el diseño de sistemas informáticos (y en particular, de aquéllos en los que, por las características del servicio que prestan, un mal funcionamiento puede provocar pérdida de vidas humanas, perjuicio económico, suspensión ...
Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Gil Tomás, Daniel Antonio; Saiz-Adalid, Luis-J.; Gil, Pedro(Institute of Electrical and Electronics Engineers (IEEE), 2014-01-24)
With the scaling of complementary metal-oxide-semiconductor (CMOS) technology to the submicron range, designers have to deal with a growing number and variety of fault types. In this way, intermittent faults are gaining ...
Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Blanc Clavero, Sara; Gil Tomás, Daniel Antonio; Gil Vicente, Pedro Joaquín(Institute of Electrical and Electronics Engineers (IEEE), 2008)
Deep submicrometer devices are expected to be increasingly sensitive to physical faults. For this reason, fault-tolerance mechanisms are more and more required in VLSI circuits. So, validating their dependability is a prior ...
Saiz Adalid, Luis José(Universitat Politècnica de València, 2016-01-07)
[EN] From the first integrated circuit was developed to very large scale integration (VLSI) technology, the hardware of computer systems has had an immense evolution. Moore's Law, which predicts that the number of transistors ...
Gracia-Morán, Joaquín; Ruiz García, Juan Carlos; Andrés Martínez, David de; Baraza Calvo, Juan Carlos; Gil Vicente, Pedro Joaquín(REFIEDU, 2014)
[EN] Nowadays, computer systems are present in almost all areas of life. However, it is very difficult to guarantee a determined Safety and Security level. Weak or incorrectly deployed Safety and Security policies may lead ...
Gil Tomás, Daniel Antonio; Gracia Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz Adalid, Luis José; Gil Vicente, Pedro Joaquín(Institute of Electrical and Electronics Engineers (IEEE), 2016-06)
As scaling is more and more aggressive, intermittent faults are increasing their importance in current deep submicron complementary metal-oxide-semiconductor (CMOS) technologies. This work shows the dependability assessment ...
Gil Tomás, Daniel Antonio; Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz-Adalid, Luis-J.; Gil Vicente, Pedro Joaquín(Elsevier, 2012-11)
As CMOS technology scales to the nanometer range, designers have to deal with a growing number and variety of fault types. Particularly, intermittent faults are expected to be an important issue in modern VLSI circuits. ...
Saiz-Adalid, Luis-J.; Gracia-Morán, Joaquín; Gil Tomás, Daniel Antonio; Baraza Calvo, Juan Carlos; Gil, Pedro(Institute of Electrical and Electronics Engineers, 2019-10-14)
[EN] Reliable computer systems employ error control codes (ECCs) to protect information from errors. For example, memories are frequently protected using single error correction-double error detection (SEC-DED) codes. ECCs ...